Materials Characterization:Introduction to Microscopic and Spectroscopic MethodsPDF|Epub|txt|kindle电子书版本网盘下载

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1 Light Microscopy1

1.1 Optical Principles1

1.1.1 Image Formation1

1.1.2 Resolution3

1.1.3 Depth of Field5

1.1.4 Aberrations6

1.2 Instrumentation8

1.2.1 Illumination System9

1.2.2 Objective Lens and Eyepiece13

1.3 Specimen Preparation15

1.3.1 Sectioning15

1.3.2 Mounting16

1.3.3 Grinding and Polishing19

1.3.4 Etching22

1.4 Imaging Modes25

1.4.1 Bright-Field and Dark-Field Imaging25

1.4.2 Phase Contrast Microscopy26

1.4.3 Polarized Light Microscopy30

1.4.4 Nomarski Microscopy34

1.4.5 Fluorescence Microscopy37

1.5 Confocal Microscopy38

1.5.1 Working Principles39

1.5.2 Three-Dimensional Images41

References43

Questions43

2 X-ray Diffraction Methods45

2.1 X-ray Radiation45

2.1.1 Generation of X-rays45

2.1.2 X-ray Absorption48

2.2 Theoretical Background of Diffraction49

2.2.1 Diffraction Geometry49

2.2.2 Diffraction Intensity56

2.3 X-ray Diffractometry58

2.3.1 Instrumentation59

2.3.2 Samples and Data Acquisition61

2.3.3 Distortions of Diffraction Spectra64

2.3.4 Applications66

2.4 Wide Angle X-ray Diffraction and Scattering71

2.4.1 Wide Angle Diffraction71

2.4.2 Wide Angle Scattering74

References76

Questions76

3 Transmission Electron Microscopy79

3.1 Instrumentation79

3.1.1 Electron Sources81

3.1.2 Electromagnetic Lenses83

3.1.3 Specimen Stage85

3.2 Specimen Preparation86

3.2.1 Pre-Thinning86

3.2.2 Final Thinning87

3.3 Image Modes89

3.3.1 Mass-Density Contrast90

3.3.2 Diffraction Contrast92

3.3.3 Phase Contrast96

3.4 Selected Area Diffraction101

3.4.1 Selected Area Diffraction Characteristics101

3.4.2 Single-Crystal Diffraction103

3.4.3 Multi-Crystal Diffraction108

3.4.4 Kikuchi Lines108

3.5 Images of Crystal Defects111

3.5.1 Wedge Fringe111

3.5.2 Bending Contours113

3.5.3 Dislocations115

References118

Questions118

4 Scanning Electron Microscopy121

4.1 Instrumentation121

4.1.1 Optical Arrangement121

4.1.2 Signal Detection123

4.1.3 Probe Size and Current124

4.2 Contrast Formation129

4.2.1 Electron-Specimen Interactions129

4.2.2 Topographic Contrast130

4.2.3 Compositional Contrast133

4.3 Operational Variables134

4.3.1 Working Distance and Aperture Size134

4.3.2 Acceleration Voltage and Probe Current137

4.3.3 Astigmatism138

4.4 Specimen Preparation138

4.4.1 Preparation for Topographic Examination139

4.4.2 Preparation for Micro-Composition Examination142

4.4.3 Dehydration142

References143

Questions144

5 Scanning Probe Microscopy145

5.1 Instrumentation145

5.1.1 Probe and Scanner147

5.1.2 Control and Vibration Isolation148

5.2 Scanning Tunneling Microscopy148

5.2.1 Tunneling Current148

5.2.2 Probe Tips and Working Environments149

5.2.3 Operational Modes149

5.2.4 Typical Applications150

5.3 Atomic Force Microscopy152

5.3.1 Near-Field Forces152

5.3.2 Force Sensors154

5.3.3 Operational Modes155

5.3.4 Typical Applications161

5.4 Image Artifacts165

5.4.1 Tip165

5.4.2 Scanner167

5.4.3 Vibration and Operation168

References169

Questions169

6 X-ray Spectroscopy for Elemental Analysis171

6.1 Features of Characteristic X-rays171

6.1.1 Types of Characteristic X-rays173

6.1.2 Comparison of K，L and M Series175

6.2 X-ray Fluorescence Spectrometry176

6.2.1 Wavelength Dispersive Spectroscopy179

6.2.2 Energy Dispersive Spectroscopy183

6.3 Energy Dispersive Spectroscopy in Electron Microscopes186

6.3.1 Special Features186

6.3.2 Scanning Modes187

6.4 Qualitative and Quantitative Analysis189

6.4.1 Qualitative Analysis189

6.4.2 Quantitative Analysis191

References195

Questions195

7 Electron Spectroscopy for Surface Analysis197

7.1 Basic Principles197

7.1.1 X-ray Photoelectron Spectroscopy197

7.1.2 Auger Electron Spectroscopy198

7.2 Instrumentation201

7.2.1 Ultra-High Vacuum System201

7.2.2 Source Guns202

7.2.3 Electron Energy Analyzers204

7.3 Characteristics of Electron Spectra206

7.3.1 Photoelectron Spectra206

7.3.2 Auger Electron Spectra208

7.4 Qualitative and Quantitative Analysis209

7.4.1 Qualitative Analysis209

7.4.2 Quantitative Analysis219

7.4.3 Composition Depth Profiling221

References222

Questions223

8 Secondary Ion Mass Spectrometry for Surface Analysis225

8.1 Basic Principles226

8.1.1 Secondary Ion Generation226

8.1.2 Dynamic and Static SIMS229

8.2 Instrumentation230

8.2.1 Primary Ion System230

8.2.2 Mass Analysis System234

8.3 Surface Structure Analysis237

8.3.1 Experimental Aspects238

8.3.2 Spectrum Interpretation239

8.4 SIMS Imaging244

8.4.1 Generation of SIMS Images244

8.4.2 Image Quality245

8.5 SIMS Depth Profiling245

8.5.1 Generation of Depth Profiles246

8.5.2 Optimization of Depth Profiling246

References250

Questions250

9 Vibrational Spectroscopy for Molecular Analysis253

9.1 Theoretical Background253

9.1.1 Electromagnetic Radiation253

9.1.2 Origin of Molecular Vibrations255

9.1.3 Principles of Vibrational Spectroscopy257

9.1.4 Normal Mode of Molecular Vibrations259

9.1.5 Infrared and Raman Activity261

9.2 Fourier Transform Infrared Spectroscopy267

9.2.1 Working Principles267

9.2.2 Instrumentation269

9.2.3 Fourier Transform Infrared Spectra271

9.2.4 Examination Techniques273

9.2.5 Fourier Transform Infrared Microspectroscopy276

9.3 Raman Microscopy279

9.3.1 Instrumentation280

9.3.2 Fluorescence Problem283

9.3.3 Raman Imaging284

9.3.4 Applications285

9.4 Interpretation of Vibrational Spectra290

9.4.1 Qualitative Methods290

9.4.2 Quantitative Methods297

References299

Questions300

10 Thermal Analysis301

10.1 Common Characteristics301

10.1.1 Thermal Events301

10.1.2 Instrumentation303

10.1.3 Experimental Parameters303

10.2 Differential Thermal Analysis and Differential Scanning Calorimetry305

10.2.1 Working Principles305

10.2.2 Experimental Aspects309

10.2.3 Measurement of Temperature and Enthalpy Change312

10.2.4 Applications315

10.3 Thermogravimetry319

10.3.1 Instrumentation321

10.3.2 Experimental Aspects322

10.3.3 Interpretation of Thermogravimetric Curves326

10.3.4 Applications328

References331

Questions331

Index333